Tungsten SEM
CIQTEK Tungsten SEM – Performance and Usability for Every Lab.
- High-Resolution Imaging – Capture clear, detailed surface structures with stable tungsten electron source technology.
- Performance You Can Trust – Excellent magnification range, versatile detectors, and reliable vacuum system ensure consistent results across diverse applications.
- Cost-Effective Solution – Achieve strong analytical capability without the higher costs of FE-SEM, making it ideal for routine and educational labs.
- User-Friendly Interface – Streamlined workflow, intuitive software, and simplified sample loading reduce operator learning time.
CIQTEK SEM2100 delivers clear, high-resolution imaging powered by a stable tungsten electron source.
Designed for education, research, and industrial inspection, it combines performance, reliability, and cost-effectiveness.
CIQTEK SEM3200 offers advanced imaging with a versatile low vacuum mode, enabling clear observation of non-conductive or delicate samples without coating. It combines high-resolution performance, flexible operating conditions, and a user-friendly interface for research and industry alike.
CIQTEK SEM3300 is equipped with a high-performance in-lens detector, delivering ultra-clear surface and fine-structure imaging at nanoscale resolution. It combines the stability of tungsten technology with advanced detection for sharp contrast and detailed analysis.