SEM CIQTEK

High-Quality SEM Instruments: Outstanding Clarity, Maximum Efficiency, and Intuitive Use.

• Top-Tier Image Quality — Achieve crisp, high contrast images even at high magnifications. FE-SEM and FIB-SEM give you ultra-high resolution to observe nanoscale features like never before.
• Outstanding Performance — Rapid scan speeds, stable beam currents, versatile detectors (BSE, EDS, etc.), minimum downtime. Whether you're profiling material surfaces, analyzing semiconductors, or studying biological structures, our SEMs deliver.
• User-Friendly Operation — Intuitive interface, streamlined sample loading, ergonomic controls. CIQTEK systems are built not only for high performance, but also for ease of use, even for non-experts.
• Flexible Solutions — Choose from the cost-effective Tungsten Filament models for solid results or upgrade to FE-SEM and FIB-SEM for higher resolution, greater depth of field, and advanced analytical capabilities.