FIB SEM

CIQTEK FIB-SEM DB550 – Precision Imaging Meets Nano-Fabrication.

CIQTEK DB550 FIB-SEM is an all-in-one platform combining a field emission scanning electron microscope with a focused ion beam (FIB) column for nanoscale imaging, analysis, and fabrication. With Super-Tunnel electron optics, a stable Ga⁺ ion beam, and integrated nano-manipulation and gas injection systems, the DB550 delivers unmatched versatility in specimen preparation, micro/nano-fabrication, and cross-sectional analysis 

• Dual Beam Power – Integrated FE-SEM and FIB column for imaging, milling, and deposition at the nanoscale.
• Super-Tunnel Electron Optics – Crossover-free beam path and low aberration design for low-voltage, high-resolution imaging.
• Stable Gallium Ion Source – Ensures precise and reliable ion beam performance for nano-fabrication, with >1000 hours exchange interval.
• Integrated Nano-Manipulator & GIS – Enables TEM lamella preparation, site-specific deposition, and lift-out operations in a single workflow.
• Versatile Applications – From semiconductor failure analysis and IC cross-sections to battery, alloy, ceramic, and polymer studies, the DB550 supports a wide range of research and industrial needs. 
• User-Friendly Interface – Highly integrated GUI with optical navigation, auto-focus, auto-stigmator, and intuitive control panel for smooth operation.

CIQTEK FIB-SEM Practical Demonstration - TEM Sample Preparation