Lattice Go XRD
Optimized for field research, on-site quality control, and space-constrained laboratories, the Lattice GO provides high-intensity data with exceptional angular precision, rivaling traditional benchtop systems. Its rugged construction, rapid scanning capability, and user-friendly operation ensure reliable results in any environment.
With the Lattice GO, high-resolution diffraction is no longer confined to the lab—bringing powerful material analysis wherever it's needed.
KEY FEATURES
• Compact and Portable Design
A lightweight, space-efficient system suitable for benchtop use or field deployment, making it ideal
for laboratories with limited space or on-site analysis.
• Rapid, In-Situ XRD Analysis
Enables immediate diffraction measurements following material synthesis, facilitating real-time
screening and informed decision-making.
• Laboratory-Grade Data Quality
Delivers high-intensity diffraction patterns with angular precision comparable to full-scale
laboratory diffractometers.
• Bragg-Brentano Diffraction Geometry
A proven configuration for accurate and reproducible powder diffraction analysis, ensuring high
data reliability.
• Advanced X-ray Source
Optimized for enhanced signal stability and consistent performance across diverse sample types.
• High-Resolution 2D Array Detector
Provides rapid data acquisition with broad angular coverage, capturing high-fidelity diffraction
patterns with excellent signal-to-noise ratio.
• Optimized Analytical Workflow
Enables efficient sample pre-screening, reducing the need for external testing and improving
overall analytical throughput.
