Park NX7

The most affordable research-grade AFM with flexible sample handling
Park NX7 has all the state-of-the-art technology you have come to expect from Park Systems, at a price your lab can afford. Designed with the same attention to detail as our more advanced models, NX7 allows you to do your research on time and within budget.

Uncompromised High Performance
Park NX7 provides accurate measurement at highest nanoscale resolution than any other products in its class.It allows you to obtain sample images and its characteristic measurements true to its nano structure thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. Furthermore, Park's unique True Non-Contact™ mode provides you with the sharpest images, scan after scan without declining resolution.
For Current and Future Needs
Park NX7 empowers you to innovate now and in the future. It gives you ready access to the largest number of measurement modes in the industry. You can employ any of these modes now, and in the future to support your evolving needs. What's more, the NX7 has the most open access design in the market that allows you to integrate and combine accessories and instruments to tailor it to your unique research requirements.
Accurate Sample Topography Measured by Low Noise Z Detector
Uses low noise Z detector signal for topography
NX electronic controller provides low Z detector noise of 0.02 nm over large bandwidth
Has no edge overshoot at the leading and trailing edges
Needs calibration done only once at the factory
Sample: 1.2 μm Nominal Step Height
(9 μm x 1 μm, 2048 pixels x 128 lines)
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