X-Ray Diffractometer (XRD)

X-Ray Diffraction (XRD) by AMI

Discover the power of advanced material characterization with AMI’s X-Ray Diffraction (XRD) systems. Engineered for high precision and reliable performance, AMI XRD enables accurate identification of crystalline phases, structural analysis, and quantitative determination of materials across research and industrial applications. With intelligent software, robust system design, and versatile sample handling, AMI XRD delivers fast, accurate, and reproducible results — making it an essential tool for materials science, pharmaceuticals, semiconductors, metallurgy, and quality control.

Lattice Series

Benchtop XRD

High-power X-ray diffractometer.
Desktop XRD combines high-power X-ray & photon-counting 2D array.
Photon-counting detector delivers lab-grade XRD in minutes.
Wide-angle goniometer (-3° - 156°).
X-ray power: 600W/1600W.
Photon-driven two-dimensional array detector.
Angle accuracy: ±0.01°.

Lattice GO

Portable X-Ray Diffractometer

Compact lightweight XRD for easy portability.
Delivers precise results within a few minutes.
Analyze anywhere / Wide-angle goniometer (0°-130°/ -3°-156°).
Angle accuracy: ±0.01°.
Reliable spectral data results with data quality comparable to large-scale XRD instruments.

InSight Series

Soft-Pack Battery Transmission X-Ray Diffractometer

Designed for in-situ transmission XRD testing of pouch cells at varied temperatures and high-temperature failure research.
Simultaneously acquiring cathode/anode XRD data.
Temperature control range: -30°C to 300°C.
Compatible with electrochemical workstations for precise control of charge-discharge and XRD data acquisition.
Allows samples of certain thickness without compromising diffraction peak resolution.