X-ray Analytical microscope
The HORIBA XGT-9000 Series X-ray Analytical Microscope is a next-generation micro-XRF spectrometer designed for non-destructive elemental analysis. With its advanced multi-probe system, flexible measurement environments, and simultaneous X-ray fluorescence and transmission imaging, the XGT-9000 Series delivers unmatched sensitivity and versatility. From detecting hidden defects to analyzing trace evidence, this instrument provides powerful solutions across industries including electronics, forensics, semiconductors, archaeology, geology, and life sciences.
- Non-Destructive Multi-Element Analysis: Perform rapid and precise micro-XRF measurements without damaging valuable or sensitive samples.
- Multi-Probe Flexibility: Wide probe selection (from 10 μm to 1.2 mm, including ultra-high intensity 15 μm and 100 μm options) with software-based switching for tailored resolution and throughput.
- Adaptable Measurement Environments: Choose from whole vacuum, partial vacuum, or optional He purge modes to optimize analysis for light elements and delicate samples.
- Dual Imaging Capability: Simultaneous elemental mapping and transmission X-ray imaging reveal hidden defects, inclusions, and structural features invisible to standard methods.
- High-Resolution Optical Imaging: Integrated cameras with advanced illumination provide clear visualization of surfaces and internal zones before and during analysis.
- Broad Application Coverage: Supports advanced studies from contamination analysis in batteries, trace evidence in forensic science, and RoHS compliance testing, to semiconductor coatings, geological samples, and even biological specimens.
- Seamless Integration: Compatible with HORIBA’s LabSpec software and Raman systems for co-localized elemental and molecular analysis.
XGT-9000
The XGT-9000 Series: Wide range of applications
Lithium-ion battery : Foreign particle analysis
The XGT-9000 Series can detect and determine the composition of foreign particles, and therefore track the source of contamination.The particle detection function within the XGT-9000 Series makes it possible to count the number of particles, characterize particle sizes, and get the coordinate position of particles to re-analyze them in detail.
Fuel cell: Catalyst loading mass and radical quencher imaging
Proton exchange membrane fuel cell, for example, includes some inorganic elements such as radical quenchers and precious metal catalysts, and the composition and the spatial distribution play important roles in the fuel cell performance. The XGT-9000 Series allows non-destructive composition analysis and elemental distribution imaging on fuel cell materials.
Electronics: Failure analysis, RoHS testing
Simultaneous imaging of transmission X-rays and fluorescent X-rays is effective to find defects inside electronic components. The XGT-9000 Series is also an effective screening tool for RoHS testing. It can perform elemental mapping to find suspicious components on a complex sample and analyze them to
obtain the concentration of the regulated elements. The software can display compliance with the RoHS thresholds with a pass/fail result.
obtain the concentration of the regulated elements. The software can display compliance with the RoHS thresholds with a pass/fail result.
Geoscience/Mineralogy: Elemental composition identification
XGT-9000 Series can be equipped with various probes and spot sizes providing comprehensive and detailed
understanding of geological and mineral samples. Chemical phase distribution can be obtained with Labspec Link function
understanding of geological and mineral samples. Chemical phase distribution can be obtained with Labspec Link function
Biology: Metabolism investigation
Elemental distribution is important to understand metabolism in biological samples. Biological samples contain water or gas and therefore cannot be measured in a whole vacuum because they will be significantly affected or damaged. The unique partial vacuum mode or optional He purge mode with the XGT-9000 Series enables analysis of biological samples without compromising sensitivity to the light elements
Archaeology: Origin investigation
Non-destructive elemental analysis is important for valuable archaeological samples, and the elemental information helps us determine when and where they were made. Elemental composition of a dragonfly eye bead (shown right) revealed that it originated in Egypt/Middle East during the 2nd century B.C. The XGT-9000
SL Series (super large chamber model) can fit large samples without compromising performance and X-ray safety.
SL Series (super large chamber model) can fit large samples without compromising performance and X-ray safety.
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