Surface Characterization

Surface Characterization Solutions

Explore cutting-edge technologies for analyzing, measuring, and understanding material surfaces at the nano- and micro-scale. Our portfolio covers advanced microscopy, spectroscopy, and tribology instruments that deliver precision, reliability, and efficiency for research and industrial applications.

1. Atomic Force Microscope (Park Systems)
Empowering innovation in nanotechnology with high-resolution surface imaging and measurement. Ideal for materials science, semiconductor, and life science research.

2. Scanning Electron Microscope (CIQTEK)
High-quality FE-SEM instruments designed for clarity, efficiency, and intuitive use. Perfect for morphology, microstructure, and advanced material analysis

3. Micro Raman Spectrometer (HORIBA Scientific)
Compact, optimized design with automated functions for fast, accurate structural and chemical analysis. Enables maximum ease of use with advanced spectroscopy performance.

4. X-ray Photoelectron Spectroscopy (Enviro)
Powerful electron spectroscopy for surface chemical analysis under various environmental conditions. Suitable for elemental composition, chemical states, and surface contamination studies.

5. Nano Micro Tribology (Rtec Instruments)
“All-in-one tribometer” enabling nano- and micro-scale mechanical testing, including friction, wear, hardness, and scratch measurements. A unique solution for material reliability and durability studies.

6. Contact Angle Tensiometer
World-leading 3D contact angle meter for precise surface wettability and adhesion analysis. Essential for coatings, biomaterials, and interface science applications.