Surface Characterization

1. Atomic Force Microscope (Park Systems)
Empowering innovation in nanotechnology with high-resolution surface imaging and measurement. Ideal for materials science, semiconductor, and life science research.

2. Scanning Electron Microscope (CIQTEK)
High-quality FE-SEM instruments designed for clarity, efficiency, and intuitive use. Perfect for morphology, microstructure, and advanced material analysis

3. Micro Raman Spectrometer (HORIBA Scientific)
Compact, optimized design with automated functions for fast, accurate structural and chemical analysis. Enables maximum ease of use with advanced spectroscopy performance.

4. X-ray Photoelectron Spectroscopy (Enviro)
Powerful electron spectroscopy for surface chemical analysis under various environmental conditions. Suitable for elemental composition, chemical states, and surface contamination studies.

5. Nano Micro Tribology (Rtec Instruments)
“All-in-one tribometer” enabling nano- and micro-scale mechanical testing, including friction, wear, hardness, and scratch measurements. A unique solution for material reliability and durability studies.

6. Contact Angle Tensiometer
World-leading 3D contact angle meter for precise surface wettability and adhesion analysis. Essential for coatings, biomaterials, and interface science applications.

7. Surface chemistry and catalytic characterization Explore comprehensive tools for investigating surface chemistry, gas adsorption mechanisms, and catalytic reactions at the molecular level.
Engineered for cutting-edge research in catalysis, materials science, and chemical engineering.

8.Supro An SEM Coater deposits a thin conductive metal layer on samples to prevent charging and enhance SEM image clarity.

9. Ellipsometer Accurion EP4 is an advanced imaging ellipsometer that combines ellipsometry and microscopy to measure thickness and refractive index on microstructures down to 1 µm. It captures all features in the field of view simultaneously and provides ellipsometric-contrast live view for detecting sub-nm details with 3D thickness mapping. Expandable accessories support measurements under controlled environments and temperature variations.

10.Active Vibration Isolation The systems help you to reduce disturbing vibrations caused by environmental influences, building vibrations and acoustic noise and ensure optimum measurement results. All measuring devices cover a bandwidth of 0.6 / 1 Hz to 200 HZ (beyond passive isolation) and have a degree of freedom of 6 directions.