Energy Dispersive Spectroscopy (EDS)
is a widely used elemental analysis technique integrated with electron microscopes (SEM/TEM) to identify and quantify the elements present in a sample. In addition to compositional analysis, EDS enables high-resolution elemental mapping from the microscale down to the nanoscale.
X-ray Fluorescence Analyzers (XRF)
Advanced XRF technology for fast, non-destructive elemental analysis with high precision for research and industrial applications.
X-ray Photoelectric Spectroscopy (XPS)
is a powerful surface analysis technique that provides precise elemental composition and chemical state information at the nanometer scale.
Ideal for advanced materials research, semiconductors, thin films, and surface chemistry investigations.