Jandel Multipurpose four point probe system
The Multipurpose four point probe system is a combination of the Multiheight Probe Stand with the RM3000 Test Unit, with the added feature of a removable X-Y microposition table
This combination allows a wide variety of samples to be measured from glass slides with TCOs or metal layers, to wafers and even ingots up to 250mm deep. For the smaller samples it is possible to locate the four point probe on precise locations by using micrometer controlled slides with the sample on top.
An optional longer post is available if taller samples are to be measured, and the base is available for measurement of samples up to 250mm diameter or as an option up to 300mm diameter.
The maximum sample size on the Micrometer controlled sample stage is 76mm diameter.
The 300mm version is available with an automated Z axis controlled by the RM3000 Test Unit.
This combination allows a wide variety of samples to be measured from glass slides with TCOs or metal layers, to wafers and even ingots up to 250mm deep. For the smaller samples it is possible to locate the four point probe on precise locations by using micrometer controlled slides with the sample on top.
An optional longer post is available if taller samples are to be measured, and the base is available for measurement of samples up to 250mm diameter or as an option up to 300mm diameter.
The maximum sample size on the Micrometer controlled sample stage is 76mm diameter.
The 300mm version is available with an automated Z axis controlled by the RM3000 Test Unit.
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